Diode Chip Tester - List of Manufacturers, Suppliers, Companies and Products | IPROS GMS

Laser Diode Chip Tester [LD2900MTB]

Achieve an efficient configuration targeting communication LDs.

This device is an LD test system that automatically measures and sorts the electrical and optical characteristics of long-wavelength (optical communication) laser diodes in bare chip state at high speed. <Features> ■ LD chips affixed to a blue sheet can be supplied and stored in a gripping ring state. High-speed fully automated transport from supply to measurement and classification. ■ Measurement items (front/back LIV, λ characteristics) can be measured as standard items under one temperature environment. ■ Measurement and sorting can be performed at any temperature from -40°C to +95°C. ■ Simultaneous measurement of FRONT light and BACK light IL is possible. ■ The SH gauging method is adopted for chip positioning. ■ The use of a focusing lens method has eliminated the alignment time for wavelength measurement. ■ Up to 9 cameras monitor the presence and condition of LD chips at each position. This allows for easy understanding of operating conditions and adjustments of various parts.